Electrical testing

Ensuring the electrical functionality of components and assemblies

Possible applications:

  • Component testing according to data sheet or customer specification
  • Electrical testing of assemblies (e.g. servers, sensors, displays)
  • Selection of components according to customer-specific electrical parameters (also in serial quantity)
  • Wafer testing
  • Function test of electronic components with high voltage, high current or high frequency
  • Function and originality test of components
    • Programming of a test sample with subsequent verification
    • Blank check to verify if components contain „unprogrammed chips“
  • In-house test program development

Using a variety of highly complex large-scale test systems as well as test applications and test programs specially generated for required examinations, the electrical functionality can be ensured for any electronic components and entire assemblies (digital, analog, mixed signal) by HTV.

Component testing according to data sheet or customer specification

During the „testing according to data sheet“, e. g. in the scope of inspection of incoming goods, various parameters are tested, even at different temperatures (room, high or low temperature, e.g. 60 °C to +150 °C).

If required, not only the electrical properties, but also dimensions, construction as well as the external general condition of the components are evaluated. Particularly for special applications, which ofte use components that exceed the specifications guaranteed by the manufacturer, the „component test accordin to customer specification“ becomes very important.
For these analog and digital components customized limits (temperature, voltage, electrical characteristics) are determined, which compliance is ensured by a variety of tests.

Electrical testing by thermostream

Due to the multitude of different measuring and testin systems as well as various special constructions it is possible to examine not only individual components (e.g. ICs, ASICs, transistors, operational amplifier) but also complex sensors, actuators, displays and entire assemblies Als with components of unclear origin the test according to the data sheet is indispensable since a first statement regarding the originality of the components can already be made without further analyses (such as X-ray, wipe test).
Another method of checking originality but also the general function for programmable components is the blank check. Among others it can be detected whether the component contains a die, if the ID number of the die is correct or if the component was already programmed.
During a „test via programming“, one sample is programmed and then verified. This enables a statement, e. g. in which way the component can be addressed and if all memory locations can be written and deleted without errors.

Selection of components according to customer
specifications

By means of a selection, components can be sorted accordin to diverse customer-specific electrical parameters. An individual classification enables to assign the components to specifically defined parameter ranges. LEDs, for example, can be divided into individual classes by its different color temperature ranges preventing the emergence of visible color or brightness deviations in the later application.

Testing of wafers

Several handling and contacting systems enable tests of components still located on wafers (also under temperature exposure) to determine defect dies early. These fail parts are colored (inked) or marked in an electronic wafer map to be sorted out after dicing of the wafer.


wafer test
electronic wafer map