A qualification includes amongst others Burn-In, temperature-variations in stress, Pressure-Cooker-tests or the like. Occurring deviations are afterwards recorded and evaluated.

Component qualification and environmental simulation Burn In

Norms and standards

E. g.:

  • AEC-Q:
    AEC-Q001, AEC-Q002,AEC-Q003, AEC-Q100, AEC-Q101, AEC-Q200, AEC-Q200
  • DIN:
    DIN IEC 60068, DIN EN 60512
  • ECSS-Q-ST-60
  • EEE-INST-002
  • J-STD-002, J-STD-020
  • JESD:
    JESD22-A101, JESD22-A102, JESD22-A103, JESD22-A105, JESD22-A108, JESD22-A110, JESD22-A112, JESD22-A113, JESD22-A114, JESD22-A115, JESD22-A118, JESD22-B100, JESD22-B101, JESD22-B102, JESD22-B106, JESD22-B107, JESD22-B117, JESD22-C101,
    JESD24, JESD47, JESD74, JESD78
  • JIS-C-5321
  • JS-001
  • MIL:
    MIL-PRF-27, MIL-STD-105, MIL-STD-202, MIL-STD-750, MIL-STD-883, MIL-PRF-19500,
    MIL-PRF-38534, MIL-PRF-55365, MIL-PRF-55681

Component qualification and environmental simulation


Especially in the case of safety-relevant use or automotive use it is essential to undergo a qualification prior to the final series application of the component. In case of a qualification, after a recorded parameter measurement of new parts, additional components have to undergo various procedures (Burn-In, temperature-variations in stress, Pressure-Cooker-tests or similar).

During these procedures intermediate measurements and – subsequent to their completion – a final measurement takes place. Occurring deviations are afterwards recorded and evaluated. Furthermore, stress-tests and life-cycle examinations can complete the qualification.

The failure rate of many components follows the typical shape of the bath-tub-curve. The elimination of early fails would thus increase both the quality and reliability accordingly. By anticipation of operating time one could get right from the beginning into the "utilization phase" of components where fails hardly occur.

Burn-in for serial production

Artificial aging anticipates operating time in quick-motion. A Burn-In of 168 hours at 125ºC corresponds to an operating time of approx. half a year. Because artificial aging deliberately generates early fails a thorough inspection after the Burn-In is strictly necessary. By applying the combined method - inspection of incoming components and artificial aging - the product quality and reliability can be increased decisively. Simultaneously, this meets the legal product liability requirements.

The essential methods of artificial aging are: high temperature storage, static Burn-In, dynamic Burn-In. In case of high temperature storage, components are being stored in a high temperature cabinet at temperatures between e.g. 100ºC and 150ºC (dependent on the type of component). The storage duration results from the desired quick-motion factor. High temperature storage is recommended for semiconductors with simple chip-geometry like diodes and transistors. In case of static Burn-In, components are being aged in the Burn-In-cabinet under supply voltage for e.g. 168 hours at 125ºC .