TÜV NORD GROUP
Digital & Semiconductor
Deutsch
⌕
About us
Group of companies
Services
Test House
ASIC Design and Testing
Testing Assemblies
Electrical Testing
MTBF Calculation
Testing Optical Parameters
Memory Qualification
Environmental Testing and Qualification
Programming
Component Programming
OTP-Alive
Long-Term Conservation
HTV-TAB®- Long-term conservation
HTV-TAB®- Long-term conservation of assemblies
HTV-TAB®- Long-term conservation of displays
HTV-TAB®- Long-term conservation of wafers & DIEs
HTV-TAB®- Long-term conservation in high-security buildings
Material changes and aging processes
Obsolescence management
Relifing of space components
HTV-EverStock
HTV-PermaDoc®
Material Analysis Institute
Material Testing
Additive Manufacturing
PFAS Substitute Qualification
Accredited test laboratory
Chemical component decapsulation
Dye & Pull Test
Uncovering component counterfeiting
Infrared Spectroscopy (FTIR)
Evaluating printed circuit boards
Light microscopy
MetaFinePrep®
Nanoindentation
Quality control of welding seams
SEM/EDX Analysis
X-ray fluorescence analysis (XRF)
X-ray inspection
Microsectioning and Ion beam etching
Ultrasonic-Microscopy (SAM)
Fully automated solderability test
Component Processing
3D lead inspection
Component drying
Tape & Reel Service
Marking procedures
Component Conditioning
Reballing
Reworking printed circuit boards
Research projects
db-creator – individual process digititalization
News/Events
HTV-Academy
Contact
Newsletter
Test House
Programming
Long-Term Conservation
Material Analysis Institute
Component Processing
HTV-Academy
Tag Archive: Wafer
Sorry, nothing to display.
Inspired by Knowledge
Contact
Legal notice
GTC
Privacy policy
About us
▽
Group of companies
Services
▽
Test House
▽
ASIC Design and Testing
Testing Assemblies
Electrical Testing
MTBF Calculation
Testing Optical Parameters
Memory Qualification
Environmental Testing and Qualification
Programming
▽
Component Programming
OTP-Alive
Long-Term Conservation
▽
HTV-TAB®- Long-term conservation
HTV-TAB®- Long-term conservation of assemblies
HTV-TAB®- Long-term conservation of displays
HTV-TAB®- Long-term conservation of wafers & DIEs
HTV-TAB®- Long-term conservation in high-security buildings
Material changes and aging processes
Obsolescence management
Relifing of space components
HTV-EverStock
HTV-PermaDoc®
Material Analysis Institute
▽
Material Testing
▽
Additive Manufacturing
PFAS Substitute Qualification
Accredited test laboratory
Chemical component decapsulation
Dye & Pull Test
Uncovering component counterfeiting
Infrared Spectroscopy (FTIR)
Evaluating printed circuit boards
Light microscopy
MetaFinePrep®
Nanoindentation
Quality control of welding seams
SEM/EDX Analysis
X-ray fluorescence analysis (XRF)
X-ray inspection
Microsectioning and Ion beam etching
Ultrasonic-Microscopy (SAM)
Fully automated solderability test
Component Processing
▽
3D lead inspection
Component drying
Tape & Reel Service
Marking procedures
Component Conditioning
Reballing
Reworking printed circuit boards
Research projects
db-creator – individual process digititalization
News/Events
HTV-Academy
Contact
▽
Newsletter
Deutsch
